The Tracer IV analyzers are based on Bruker’s XFlash® Silicon Drift Detectors (SDD) which features high count rate capability while retaining excellent resolution. The SDD detectors are especially sensitive for light element analysis. Combine the closed optical coupling between sample and detector with the patented NASA vacuum technology to achieve the best sensitivity available across the elemental range (Mg-U).
For best light element performance under air, select the 30mm2 GEO model, designed to measure Mg in Basalt. For all other applications the 10mm2 offers superior performance!
The TRACER IV series is the CROSSOVER in the handheld XRF field: Using the basic 4 primary beam filters and secondary target set from the Tracer III series in the automated filter changer, it allows the user to use automated dual beam assay. With this capability a wide range of factory calibrations can be provided, which can be customized directly by the customer. These applications enable the point and shoot operation but also operate on the desktop.
The Windows based PDA control features Bluetooth, WIFI and USB connectivity and supports inexpensive memory extension using either SD or CF memory cards for nearly unlimited storage of results and spectra. Using a Windows PC, no proprietary vendor software is needed to connect to the PDA to add and modify applications.
Each Tracer IV system includes a foldable desktop stand and interface cables that allows the unit to operate in benchtop mode.
The S1 PXRF software enables the user to fully control all acquisition parameters. Direct PC sample readout is achieved with an empirical calibration EXCEL® based macro. XRayOps allows the free selection of excitation parameters and filters.
The open software architecture allows the user to acquire and view live spectral data with complete control of the acquisition conditions. In addition, the calibration software allows the user not only to modify factory calibrations but to create, exchange and modify their own calibrations using SPECTRA EDX- which is the same software used on the Bruker S2 RANGER series. SPECTRA EDX enables users to use full FP methods, advanced influence coefficient approach, or classical empirical calibrations. Analysis can then be run using a laptop, while operating the unit in benchtop mode or loaded on the Windows Mobile driven PDA for field work.